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This report visually generates a representation of a wafer showing either Bins or Soft Bins. The report can be run for multiple wafers and multiple lots. , The output of the reports can be aggregated by bin population/wafer yields by wafer, lot, or test program. You can compare multiple wafer maps using the wafer map thumb nail galleries to see if there are any repeating patterns across wafers. [Applicable to only Wafer Probe Data] | |||
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