|
 |
| Stacked Histogram |
 |
This
report allows you to generate Bin summaries for both Wafer
probe data as well as Final Test Data based on Bins, Soft
Bins, as well as User Defined Bin Groups. The report shows
you the yield for the selected data as well as other
statistics as a series of stacked histograms. You can run
the report for a single data set or for a series of
selected lots/wafers. [Applicable to both Wafer Probe as
well as Final Test Data] |
|
|
|
