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yieldWerx is the perfect solution for engineers who want
to monitor their products throughout the manufacturing processes.
You can perform any statistical analysis on your semiconductor
data, from analyzing a Mean, Median, Sigma, range, Cp, Cpk
or yield. Using the yieldwerx menus or playing with the many
filtering options, you can change the data and immediately
see the effect on Mean, Median, Sigma, range, Cp, Cpk and
yield. Smart Data Labels allow for access to detailed data
on the die plotted, without cluttering the graph too much,
visually analyze the correlation in results.
Start your semiconductor data analysis by either uploading
your test data files from to yieldWerx ( Tester
to Tester Correlation Analysis Software ) for semiconductor
characterization Statistical data analysis, or running a query
over the database for production Statistical data analysis.
You can upload semiconductor test data file formats such as
STDF ( STDF V3 and STDF V4) , ATDF , WAT , PCM and comma separated
value file ( CSV ). Upload STDF, ATDF, CSV files just in one
click into the yieldWerx database. You need to upload the
files once in yieldWerx then you can modify the already uploaded
STDF, ATDF files data for further Statistical calculations.
This functionality provides the test time reduction and test
cost optimization. yieldWerx allows unlimited files to be
uploaded and automatically inserted into the database.
yieldWerx includes a built-in functions so you can edit
and save any semiconductor data file ( STDF , ATDF , WAT ,
PCM , etc ) . This powerful tool lets your edit any information
including parameter values, parameter test limits, binning
results, die location, testing site or testing head and much
more! yieldWerx lets you filter your semiconductor data in
many ways, in only one mouse click.
In yieldWerx the process is simplified enough that you get
a "graphical view" and can easily analyze labels.
You can save your test data in favorites. So you can select
any saved data any time.
Edit data once it is in the Yield Power Database, YieldWerx
( Tester to Tester Correlation Analysis Software ) lets you
review all critical statistical information for each test
parameter analyzed, Parameter name, specification limits,
test execution count, failure rate, parameter Yield level,
Mean, Range, Sigma, Cp, Cpk for standard semiconductor characterization
or production lot distribution. Also, yieldWerx ( Tester to
Tester Correlation Analysis Software ) offers a large range
of advanced statistical information such as Quartiles, Median,
distribution Skew or Kurtosis values.
yieldWerx lets you easily compare any test statistics values
like Mean, Median, Sigma, range, Cp, Cpk and yield of different
parameters or tests and computes shifts automatically for
you. If a drift between datasets is higher than a user configurable
limit, Mean, Sigma or Cpk drifts are highlighted in red and
flagged in a summary page. Each alarm level for the Mean,
Sigma and Cpk can be defined or disabled independently. This
functionality lets you easily analyze and compare distributions
and conduct any correlation analysis in a matter of minutes.
This is an ideal canned report for any tester correlation
or process correlation analysis ( tester vendor qualification,
subcontractor qualification, etc)
Create histograms quickly and easily for ( Tester to Tester
Correlation Analysis Software ) using entire data columns
or just a selection of your data for semiconductor data analysis
with yieldWerx. You can also enter into the interactive mode
at any time and browse into interactive histograms you can
customize on the flight, unlimited number of parameter histograms,
modify charting styles, etc. This is a powerful tool for semiconductor
characterization missions when starting a new production and
comparing testers to testers or load board to load board.
It is also a powerful tool when performing semiconductor correlation
over different IC products release or test program revisions.
No matter what semiconductor characterization or correlation
analysis you want to do, yieldWerx ( Tester to Tester Correlation
Analysis Software ) will be a great companion. Histogram charts
also let you enable or hide test statistics markers such as
test limits, Mean, 1, 3 or 6 Sigma space and also display
test statistics tables including: Mean, Median, Sigma, Range,
Failing count, Cp, Cpk, Yield and advanced test statistics
such as Quartiles, Skew, Kurtosis values.
The Best choice to create semiconductor wafer map charts,
yieldWerx ( Tester to Tester Correlation Analysis Software
) allows you to create different sets of wafer maps. In few
clicks, yieldWerx turns any of your STDF, ATDF, PCM, WAT or
CSV semiconductor data into 2D and 3D wafermaps including
Stacked wafer map, hardware binning wafer map, parametric
wafer map ( see how a parameter value evolves on each die
). Using the exports facility of wafer map report, you can
instantly share such valuable chart with others on your intranet
or by email. And leveraging yieldWerx powerful interactive
interface, you can rotate and drill into your wafer map at
any zooming level. The yieldWerx contextual selection lets
you click any die and know all about it. Its die location,
tester site and head used, tests executed and failures, and
more!
yieldWerx ( Tester to Tester Correlation Analysis Software
) offers a very easy and fast interface to select your test
data files ( like STDF, ATDF, PCM, WAT or CSV ) and filter
the information to process for your semiconductor characterization.
When leveraging the yieldWerx ( Tester to Tester Correlation
Analysis Software ) built-in database, you can review the
data file headers at insertion time and edit the fields used
a keys for future test data queries.
yieldWerx ( Tester to Tester Correlation Analysis Software
) allows you to customize the content of the report created
so only the information you want to focus on remains.
For Example: The user is studying semiconductor characterization,
end-users may prefer to focus on test parameters with Cpk
lower than 1.22. Its very easy with few mouse clicks to try
different reports outputs to analyze different data sets for
different needs.
yieldWerx provides ( Tester to Tester Correlation Analysis
Software ) facility to print or export your reports, or capture
any chart into your clipboard for instant export into other
applications ( Microsoft Office: Word, Excel, PowerPoint,
etc ). Any exported report page ( including test statistics
with Mean, Median, Sigma, range, Cp, Cpk, yield and advanced
statistics as well as histograms, trends charts, scatter plots
and wafer maps ) can be printed individually or all at once
simply clicking the yieldWerx printer buttons.
In yieldWerx ( Tester to Tester
Correlation Analysis Software ) Histogram is the best source
to view your Semiconductor test like Mean, Median, Sigma,
Cp, CPK and yield graphically. You can compare Mean, Median,
Sigma, Mean Cp, CPK and yield of different label.
Complete
Control of Application
yieldWerx ( Tester to Tester Correlation Analysis Software
) used in a real-time production environment can greatly benefit
of the Monitoring module. This module allows to automate all
reports creation (including the statistical analysis with
Mean, Median, Sigma, range, Cp, Cpk and yield ) as well as
notify on any abnormal yield level or parameter out of specs.
Parameter specs monitored in real-time include: semiconductor
test result, Mean, Sigma, range, Cp, Cpk and yield levels.
The Semiconductor industry relies on Unix systems especially
for all production tasks due to the stability of the servers.
As such, limiting a data analyzing tool to a Unix or Widows
only technology is a technical bottle neck for any serious
corporate deployment of the solution. yieldWerx currently
offering software in windown but the engineers of yieldWerx
is working on the Unix version and will be aviable soon. For
yieldWerx engineers have been dealing daily with semiconductor
leading companies and have built a strong know-how about their
needs. YieldWerx has been designed to run on any existing
platform and easily interface to any third-party tools if
needed.
YieldWerx is the best Software for STDF analysis.
With a utility for STDF conversion. You can convert STDF files
in to text file and then you can convert it into many formats
like STDF to Excel, STDF to database, STDF to Text and STDF
to XML.
The files you converted for STDF analysis are easily imported
in to the YieldWerx
You can start STDF analysis by either uploading a test data
file to the YieldWerx database for functional and final test,
or by manually entering test data for Statistical calculations
for different test limits. File formats such as STDF, ATDF,
and Excel may be opened directly in YieldWerx for STDF analysis.
You can upload STDF, ATDF, CSV files just in one click. You
need to upload the STDF, ATDF files once in the YieldWerx
( Tester to Tester Correlation Analysis Software ) then you
can modify the already uploaded STDF, ATDF files data for
further STDF analysis in different test limits. This functionality
provides the test time reduction and test cost optimization.
You can view the Semiconductor data uploaded through STDF
files before the for your semiconductor data analysis in statistical
limits. You can upload unlimited SDTF and ATDF files for STDF
analysis.
Best for Tester to Tester Correlation Analysis
Download your free 15 day demo, click
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