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yieldWerx is the perfect solution for engineers who want
to monitor their products throughout the manufacturing processes.
You can perform any statistical analysis on your semiconductor
data, from analyzing a Mean, Median, Sigma, range, Cp, Cpk
or yield. Using the yieldwerx menus or playing with the many
filtering options, you can change the data and immediately
see the effect on Mean, Median, Sigma, range, Cp, Cpk and
yield. Smart Data Labels allow for access to detailed data
on the die plotted, without cluttering the graph too much,
visually analyze the correlation in results.
Start your semiconductor data analysis by either uploading
your test data files from to yieldWerx ( STDF
Data Analysis Tools ) for semiconductor characterization
Statistical data analysis, or running a query over the database
for production Statistical data analysis. You can upload semiconductor
test data file formats such as STDF ( STDF V3 and STDF V4)
, ATDF , WAT , PCM and comma separated value file ( CSV ).
Upload STDF, ATDF, CSV files just in one click into the yieldWerx
database. You need to upload the files once in yieldWerx then
you can modify the already uploaded STDF, ATDF files data
for further Statistical calculations. This functionality provides
the test time reduction and test cost optimization. yieldWerx
allows unlimited files to be uploaded and automatically inserted
into the database.
yieldWerx includes a built-in functions so you can edit
and save any semiconductor data file ( STDF , ATDF , WAT ,
PCM , etc ) . This powerful tool lets your edit any information
including parameter values, parameter test limits, binning
results, die location, testing site or testing head and much
more! yieldWerx lets you filter your semiconductor data in
many ways, in only one mouse click.
In yieldWerx the process is simplified enough that you get
a "graphical view" and can easily analyze labels.
You can save your test data in favorites. So you can select
any saved data any time.
Edit data once it is in the Yield Power Database, YieldWerx
( STDF Data Analysis Tools ) lets you review all critical
statistical information for each test parameter analyzed,
Parameter name, specification limits, test execution count,
failure rate, parameter Yield level, Mean, Range, Sigma, Cp,
Cpk for standard semiconductor characterization or production
lot distribution. Also, yieldWerx ( STDF Data Analysis Tools
) offers a large range of advanced statistical information
such as Quartiles, Median, distribution Skew or Kurtosis values.
yieldWerx lets you easily compare any test statistics values
like Mean, Median, Sigma, range, Cp, Cpk and yield of different
parameters or tests and computes shifts automatically for
you. If a drift between datasets is higher than a user configurable
limit, Mean, Sigma or Cpk drifts are highlighted in red and
flagged in a summary page. Each alarm level for the Mean,
Sigma and Cpk can be defined or disabled independently. This
functionality lets you easily analyze and compare distributions
and conduct any correlation analysis in a matter of minutes.
This is an ideal canned report for any tester correlation
or process correlation analysis ( tester vendor qualification,
subcontractor qualification, etc)
Create histograms quickly and easily for ( STDF Data Analysis
Tools ) using entire data columns or just a selection of your
data for semiconductor data analysis with yieldWerx. You can
also enter into the interactive mode at any time and browse
into interactive histograms you can customize on the flight,
unlimited number of parameter histograms, modify charting
styles, etc. This is a powerful tool for semiconductor characterization
missions when starting a new production and comparing testers
to testers or load board to load board. It is also a powerful
tool when performing semiconductor correlation over different
IC products release or test program revisions. No matter what
semiconductor characterization or correlation analysis you
want to do, yieldWerx ( STDF Data Analysis Tools ) will be
a great companion. Histogram charts also let you enable or
hide test statistics markers such as test limits, Mean, 1,
3 or 6 Sigma space and also display test statistics tables
including: Mean, Median, Sigma, Range, Failing count, Cp,
Cpk, Yield and advanced test statistics such as Quartiles,
Skew, Kurtosis values.
The Best choice to create semiconductor wafer map charts,
yieldWerx ( STDF Data Analysis Tools ) allows you to create
different sets of wafer maps. In few clicks, yieldWerx turns
any of your STDF, ATDF, PCM, WAT or CSV semiconductor data
into 2D and 3D wafermaps including Stacked wafer map, hardware
binning wafer map, parametric wafer map ( see how a parameter
value evolves on each die ). Using the exports facility of
wafer map report, you can instantly share such valuable chart
with others on your intranet or by email. And leveraging yieldWerx
powerful interactive interface, you can rotate and drill into
your wafer map at any zooming level. The yieldWerx contextual
selection lets you click any die and know all about it. Its
die location, tester site and head used, tests executed and
failures, and more!
yieldWerx ( STDF Data Analysis Tools ) offers a very easy
and fast interface to select your test data files ( like STDF,
ATDF, PCM, WAT or CSV ) and filter the information to process
for your semiconductor characterization. When leveraging the
yieldWerx ( STDF Data Analysis Tools ) built-in database,
you can review the data file headers at insertion time and
edit the fields used a keys for future test data queries.
yieldWerx ( STDF Data Analysis Tools ) allows you to customize
the content of the report created so only the information
you want to focus on remains.
For Example: The user is studying semiconductor characterization,
end-users may prefer to focus on test parameters with Cpk
lower than 1.22. Its very easy with few mouse clicks to try
different reports outputs to analyze different data sets for
different needs.
yieldWerx provides ( STDF Data Analysis Tools ) facility
to print or export your reports, or capture any chart into
your clipboard for instant export into other applications
( Microsoft Office: Word, Excel, PowerPoint, etc ). Any exported
report page ( including test statistics with Mean, Median,
Sigma, range, Cp, Cpk, yield and advanced statistics as well
as histograms, trends charts, scatter plots and wafer maps
) can be printed individually or all at once simply clicking
the yieldWerx printer buttons.
In yieldWerx ( STDF Data Analysis
Tools ) Histogram is the best source to view your Semiconductor
test like Mean, Median, Sigma, Cp, CPK and yield graphically.
You can compare Mean, Median, Sigma, Mean Cp, CPK and yield
of different label.
Complete
Control of Application
yieldWerx ( SSTDF Data Analysis Tools ) used in a real-time
production environment can greatly benefit of the Monitoring
module. This module allows to automate all reports creation
(including the statistical analysis with Mean, Median, Sigma,
range, Cp, Cpk and yield ) as well as notify on any abnormal
yield level or parameter out of specs. Parameter specs monitored
in real-time include: semiconductor test result, Mean, Sigma,
range, Cp, Cpk and yield levels.
The Semiconductor industry relies on Unix systems especially
for all production tasks due to the stability of the servers.
As such, limiting a data analyzing tool to a Unix or Widows
only technology is a technical bottle neck for any serious
corporate deployment of the solution. yieldWerx currently
offering software in windown but the engineers of yieldWerx
is working on the Unix version and will be aviable soon. For
yieldWerx engineers have been dealing daily with semiconductor
leading companies and have built a strong know-how about their
needs. YieldWerx has been designed to run on any existing
platform and easily interface to any third-party tools if
needed.
YieldWerx is the best Software for STDF analysis.
With a utility for STDF conversion. You can convert STDF files
in to text file and then you can convert it into many formats
like STDF to Excel, STDF to database, STDF to Text and STDF
to XML.
The files you converted for STDF analysis are easily imported
in to the YieldWerx
You can start STDF analysis by either uploading a test data
file to the YieldWerx database for functional and final test,
or by manually entering test data for Statistical calculations
for different test limits. File formats such as STDF, ATDF,
and Excel may be opened directly in YieldWerx for STDF analysis.
You can upload STDF, ATDF, CSV files just in one click. You
need to upload the STDF, ATDF files once in the YieldWerx
( Semiconductor ATE Test Data and Yield Analysis Software
) then you can modify the already uploaded STDF, ATDF files
data for further STDF analysis in different test limits. This
functionality provides the test time reduction and test cost
optimization. You can view the Semiconductor data uploaded
through STDF files before the for your semiconductor data
analysis in statistical limits. You can upload unlimited SDTF
and ATDF files for STDF analysis.
Best for STDF Data Analysis Tools
Download your free 15 day demo, click
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