yieldWerx Semiconductor Test Data Analysis : Best Solution for Semiconductor test data analysis, STDF, ATDF

	Zonal Yield		Wafer Probe Correlation & Analysis

	Full Wafer Correlation		Partial Wafer Correlation

	Final Test Data Correlation & Analysis		Tester to Tester Yield

	Prober to Prober Yield		Probe Card to Probe Card Yield

	Load Board to Load Board Yield		Site to Site Yield

	Bar Graph		Box Plot

	Data Extraction		Data Summary

	Parametric Failure Report		Parametric Histogram

	Parametric Trend Chart		Parametric Wafer Map

	Stacked Histogram		Stacked Wafer Map

	Wafer Map		XY Scatter