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You can generate wafer maps for test parameters and visually see the distribution of results by die location. The report can aggregate data from multiple wafers and stack them for cross wafer or lot analysis. The report can also be run for parametric zonal analysis simply by sorting results by wafer. The report can be used for both Parametric as well as Functional test parameters. Options exist to screen/filter data based on Tukey and user defined limits. [Applicable to only Wafer Probe Data] | |||||
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