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This report allows you to generate trend charts for either a single parameter or groups of parameters where the units of measurements are similar. Graphically allows you to visualize trends/relationships as well as other key statistics. The report can be run for a single data set or a series of lots/wafers. You can filter, as well as group, data with a wide range of options [Applicable to both Wafer Probe as well as Final Test Data] |
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