|
|||||||||||||||||
 |
Generates histograms for a given test parameter and represents the data as a series of classes. The report can aggregate data from multiple wafers and stack them for cross wafer or lot analysis. The report can be used for both Parametric as well as Functional test parameters. Options exist to filter data based on Tukey, user defined limits, as well as user definable classes for the data. [Applicable to both Wafer Probe as well as Final Test Data] |
||||||||||||||||
|
|||||||||||||||||
|