yieldWerx Semiconductor Test Data Analysis : Best Solution for Semiconductor test data analysis, STDF, ATDF

yieldWerx Semiconductor. Test & Yield Management Solutions

yieldWerx offers product and test engineers a collection of reliable, easily manageable, and robust tools that help improve productivity, improve yield, and reduce defects in the assembly line. yieldWerx converts semiconductor test data files into comprehensive reports, which provides graphical and statistical representation of data and reduces defect analysis cycle time for test engineers.

Our aim is to lower the cost and time for analysis of semiconductor test data through provision of concurrent, effective, and efficient solutions. yieldWerx Semiconductor is one of the pioneers in test data acquisition, analysis and reporting for semiconductor companies, design houses, and engineering groups. The solutions offered by yieldWerx Semiconductor have demonstrated success at lowering the overall cost of semiconductor testing, progressive improvement in quality, and bringing excellence in semiconductor test operations.

yieldWerx Benefits	yieldWerx Users
Increased Yield Increased Operational Efficiency Reduced Test Time Accuracy and Data Integrity	Production floor operators and engineers Product development and design engineers Failure analysis / Quality assurance engineers Yield and Process improvement engineers Field application and Support engineers

Data Formats Supported

Foundry Data Formats Supported

yieldWerx supports Klarf, STDF, ATDF, WAT & PCM and other Custom Data Formats. The yieldWerx Database’s WAT & PCM loader has been enhanced to additionally support the following foundry data formats.

yieldWerx! Semiconductor Data Analysis Solution

yieldWerx provides a suite of test data acquisition, analysis and reporting solutions for semiconductor companies/design houses and engineering groups. With easy access to production data, engineering data from manufacturing processes, wafer probe data , final test data as well as other external data sources,

yieldWerx allows the product, device and process engineers the ability to quickly study, diagnose and put in place corrective actions enabling fast and efficient product release as well as driving yield enhancements.

With built in support in yieldWerx Database for STDF and ATDF data formats, and the ability to customize to your data formats, yieldWerx is the perfect solution for semiconductor test data analysis.

yieldWerx Reports

Zonal Yield
	Wafer Probe Correlation
Parametric Wafer Map	Full Wafer Correlation
Partial Wafer Correlation
	Final Test Correlation & Analysis
	Tester to Tester Yield Analysis
Wafer Map	Prober to Prober Yield Analysis
Parametric Wafer Map	Probe Card to Probe Card Yield
Stacked Wafer Map	Load Board to Load Board Yield
Site to Site Yield Analysis