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  yieldWerx - Future Releases

yieldWerx continuously updates & releases enhancements to the user community. These enhancements are sometimes user driven & also incorporate added functionality to the yieldWerx analysis tool kit. Some of the currently being developed are:
 
Integration with physical defect data sources
Front To Back End Correlation & Analysis Routines/Reports
Zonal Reporting Capabilities
WECO Rule Modules
Integration with specialized analysis toolkits
Six Sigma/SPC Charts & Reporting expanding upon:
Box Plot (with or without notches and with or without outliers)
Linear Regression
Histogram (with or without normal curve and z-scores interactivity)
Frequency Polygon (with or without normal curve and z-scores interactivity)
Cumulative Frequency (Ogive)
Statistical Process Control (SPC)
X Charts
R Charts
P Charts
NP Charts

Central Tendency Mean X/Y Correlation
Skewness Linear Regression
Z-Scores Pearson's Coefficient
Error Bars Coefficient of Determination
    Standard Error of Estimate
    F-Statistic (Regression)
      t-Statistic (Regression.

Two Populations  
Equal Variances F-Test    
Equal Means t-Test.    
       

Two Populations
Statistical Process Control (SPC)
Equal Variances F-Test LPpk
Equal Means t-Test Sum of Squares Treatments. Pp
       
Anova
 		    
Sum of Squares Error    
Sum of Squares Total    
d.o.f. Treatments    
d.o.f. Error    
d.o.f. Total    
Mean Square Treatments    
Mean Square Error    
F-Statistic (Anova)