Full Wafer Correlation

In this case the wafer is probed on the initial tester in its entirety. The STDF file is loaded to yieldWerx and marked as the base line data or ‘golden’ data. The wafer is then retested on the second tester, again in its entirety, and the resulting STDF file loaded to yieldWerx.
The newly loaded STDF file is then analyzed in light of the baseline data, and compared to see whether or not the data correlates. Allows the user to generate multiple analysis reports, and take appropriate actions.