Filters & Analysis

The following new features have been supplemented in all parametric reports:

• Select multiple devices, test programs, lots, wafers, and parameters
• Highlighted values (min, max, mean, +/- 3S) for selection of limits or statistical pointers you want plotted on the charts.
• Union & Intersection – Quickly determine what key parameters are common and see variations between common devices.
• Select the bin range to filter reports data by Bin(s).
• Filter Lots selection by Date Ranges
• UChangeable Axis labels
• Apply any of the filters and see how many data points were excluded from the analysis – Allows you to perform what if analysis.

New reports to list all lots and their related wafers, with advance search options to apply filters between different lots.

Double click on a lot or wafer number to bring up the Lot or Wafer’s characteristics, and summary data. Additionally allows the users to attach any file (images, specs, lot travelers, specs, data sheets etc) at either the lot level or wafer level