yieldWerx Semiconductor Test Data Analysis : Best Solution for Semiconductor test data analysis, STDF, ATDF

Interactive Demos

The Interactive Demos are meant to provide users with insight into yieldWerx features. Click on any of the Interactive Demos to view the presentation in full screen format.

Note: (You can navigate the speed of the presentation by using the forward and rewind controls at the bottom of the presentation)

Parametric Trend Chart	Parametric Wafer Map

Stacked Histogram	Stacked Wafer Map

Wafer Map	XY Scatter

Bar Graph	Box Plot

Data Extraction	Data Summary

Parametric Failure Report	Parametric Histogram

Data Selection	Add/Remove Favorites