Parametric Failure Report

Data Reports: A very simple report that shows you the top most failing tests based on limits included in the data source or user specified. Useful for showing you what tests are failing the most and for you to take corrective action on – conversely you can also see which tests are failing the least and decide to modify the test program to take the non critical ones out to save test times. [Applicable to both Wafer Probe as well as Final Test Data].

Data Extraction: Applicable to both Wafer Probe as well as Final Test Data]

Data Summary: Statistically analyze the results for any test parameter, and view the Mean, Standard Deviation, Cp, Cpk, Yield, and other statistical results for selected test parameters, wafers and or lots. [Applicable to both Wafer Probe as well as Final Test Data]