Management Team

Aftkhar Aslam

Co-Founder and CEO

Aftkhar Aslam has over 30 years of experience in the semiconductor industry, especially in the test and yield enhancement areas. He previously played an instrumental role as an IT Director at Texas Instruments and participated in creating joint venture semiconductor fabs and OSATs across the world.

Omar M. Malik

Co-Founder and COO

Omar has over 23 years of experience in software products and technology consulting. As COO, he leads yieldWerx's growth into new markets, and the execution of new business development initiatives. He has an MBA from INSEAD France and BSc in Finance from Georgetown University.

Waheed Ahmed

Manager Programming

With over 15 years in enterprise software development, Waheed Ahmed has led diverse projects. As the Programming Manager, he mentors teams towards technical excellence, excelling in Microsoft.NET technologies and managing global deliveries through yieldWerx’s global development and product support teams.

Lincoln Evans-Beauchamp

Yield Management Specialist

Seasoned semiconductor data scientist, he has previously served a senior positions at PDF Solutions and Applied Materials. He leads yieldWerx’s development of advanced algorithms to enhance and optimize semiconductor yield, and enhancing the predictive prepositioning of maintenance parts.

Frank Poehl

Director of Business Development – Europe

25+ year experienced entrepreneurial manager of international Design-for-Test, Test Development, and Yield Management organizations. Formerly worked in various roles from DfT implementation engineer to senior management positions at Apple, Intel and lnfineon Technologies.

Joseph Orozco

Director - Product Engineering

Over 20 years of work experience in Front-End and Back-End Semiconductor Industry spanning from NPI, Product/Test Engineering,  and Fab/Test Subcon Management at top multi-national companies. Spearheaded collaboration with multiple data-analytics company on implementation of zero defect programs and enhancement of data integrity, usability, and processing speed.

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