Semiconductor Data Analysis Software
Your Test & Yield Analysis Solution House

Cross Work Center Analysis

CrossWorkCenter Module – WAT & PCM » Wafer Sort » Final Test Data Correlation & Analysis Engine

yieldWerx now provides you with the ability to run cross work centers/test area analysis and reporting with just a few key clicks.

  • Analyze a parameter from WAT & PCM vs. Wafer Sort or to Final Test Data
  • Cut-down significantly, the time for searching, copying, and merging test data.
  • Quickly join data sets using the Lot History & Genealogy tool in conjunction with the Correlation & Analysis tool.
  • Simply find any lot or data point you’re interested in and then drill upwards or down the Lot History or Genealogy tree to any of the other related data.
  • Use the Lot Data Extraction feature to merge data from different test area’s pre-merged, and export data to other analysis tools such as JMP or SAS

Parametric Trend Chart

Parametric Histogram

Data Extraction


Data Summary


Box Plot