Cross Work Center Analysis

Yieldwerx now provides you with the ability to run cross work centers/test area analysis and reporting with just a few key clicks.

• Analyze a parameter from WAT & PCM vs. Wafer Sort or to Final Test Data
• Cut-down significantly, the time for searching, copying, and merging test data.
• Quickly join data sets using the Lot History & Genealogy tool in conjunction with the Correlation & Analysis tool.
• Simply find any lot or data point you’re interested in and then drill upwards or down the Lot History or Genealogy tree to any of the other related data.
• Use the Lot Data Extraction feature to merge data from different test area’s pre-merged, and export data to other analysis tools such as JMP or SAS

Parametric Trend Chart	Parametric Histogram
Data Extraction	Data Summary
Box Plot