Correlation Analysis

Lets you analyze data across test log points – compare a parameter from WAT/PCM to Wafer Sort to Final Test or any other combination. If using the Lot Genealogy Module from Yieldwerx – the user only has to select the Lot number once from any of the different test data points and the other data is automatically made available for the user instead of them having to manually hunt for it.

Wafer Probe Correlation & Analysis	Full Wafer Correlation
Partial Wafer Correlation	Final Test Data Correlation & Analysis