Semiconductor Data Analysis Software
Your Test & Yield Analysis Solution House
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    Test & Yield
    Management Solutions

    yieldWerx offers product and test engineers a collection of reliable, easily manageable, and robust tools that help improve productivity, improve yield, and reduce defects in the assembly line. yieldWerx converts semiconductor test data files into comprehensive reports, which provides graphical and statistical representation of data and reduces defect analysis cycle time for test engineers.

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    yieldWerx Process Details

    yieldWerx offers product and test engineers a collection of reliable, easily manageable, and robust tools that help improve productivity, improve yield, and reduce defects in the assembly line. yieldWerx converts semiconductor test data files into comprehensive reports, which provides graphical and statistical representation of data and reduces defect analysis cycle time for test engineers.

    yieldWerx provides a suite of test data acquisition, analysis and reporting solutions for semiconductor companies/design houses and engineering groups. With easy access to production data, engineering data from manufacturing processes, wafer probe data , final test data as well as other external data sources

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    yieldWerx Components

    Lot Genealogy Tool:
    Tie in lot history and genealogy data together with the test data so an engineer can being their analysis from anywhere in the lots history.

    Automated Data Loaders:
    Load data real time or on a periodic basic with functionality to auto correct missing data, implement rules based on work center, device, test algorithm and lot numbers.

    Automatic Report Generation Module:
    Execute commonly accessed/needed report on any time basis with the results being published to select locations.

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    Yield Monitoring

    yieldWerx provides a lot of reports to monitor yield. It includes yield by test program, device or via a single key click monitor the yield trends. The next release of yieldWerx will introduce real time alerts, in that the user can set control limits and if the yield drops below a certain % then registered users will get email notifications as to what lots have a yield issue.

    Prober to Prober Analysis
    Prober Card to Prober Card Analysis
    Load Card to Load Card Analysis
    Site to Site Analysis

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    Smart Probe

    Wafer Map Layout & Real Time Data Collection/Control. The savings, reduction in test times, ability to monitor and detect anomalies and issues quickly, react to hardware failures and save valuable data and continue probing from where you left off and more – can very quickly mean many thousands of dollars/millions of dollars of savings for large test floors.

    Ability to probe the back and front of wafer (e.g. LED devices) – in either order and then only probe the die that passed from the first pass.

    Probe only predefined die and skip die, to avoid probe card damage e.g. in the case of  bumped die where you don't want to touch down and probe die with bad bumps.

Smart Probe

smart probe
The SmartProbe module, an exciting addition to the yieldWerx Suite now offers the ability to interface directly with test equipment and allows the engineer define what and how they want to probe a particular device/wafer. There are two key sub modules, the first provides the Device Definition functionality, allowing the engineer to define a wafer size, die size characteristics and then quickly draw out and edit the wafer map. Allowing the engineer to mark the home die, reference die, remove and add die so that it’s an accurate representation of the actual wafer map for the device.
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Yield Monitor

smart probe
The user can automate Yield Reports – including yield by test program or device and via a single key click monitor the yield trends. yieldWerx has introduce real time alerts, in which a user can set control limits and if yield drops below a certain % then registered users will get email notifications as to what lots have a yield issue.

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Lot Genealogy

smart probe
A powerful Lot Genealogy & History tool that is simple and quick to use for test and quality control engineers, as well as operators and technicians.

  • Accelerated and easy tracking of incoming wafers & lots from foundries and other vendors & suppliers.
  • Comprehensive mapping of incoming Lot Numbers & Device Names to internal Lot and Device Names.
  • Quick importing & exporting of pertinent data from SAP, ERP, & MES systems.

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yieldWerx Supported Data Format

yieldWerx supports Klarf, STDF, ATDF, WAT & PCM and other Custom Data Formats. The yieldWerx Database's WAT & PCM loader has been enhanced to additionally support the following foundry data formats.

Foundries

  • SMIC
  • TSMC
  • UMC
  • ASMC
  • HHNEC
  • GSMC
  • Fujitsu
  • and many others...

 

Test Equipment

  • LTX/Credence
  • Teradyne (including Eagle)
  • and many others...

 

Datalogs

  • CSV
  • STDF
  • ATDF
  • and more...

 

Test & Assembly

We support data from the most popular test and assembly houses.

Our User

yieldWerx, the most Powerful and Reliable tool allows the product, device and process engineers the ability to quickly study, diagnose and put in place corrective actions enabling fast and efficient product release as well as driving yield enhancements.

yieldWerx Solutions are successfully running in wafer fabs, design houses, fabless companies, large test houses as well as test equipment manufacturers across USA, Canada, Europe & Asia Pacific.