Welcome to yieldWerx! Semiconductor Data Analysis Solution yieldWerx provides a suite of test data acquisition, analysis and reporting solutions for semiconductor companies/design houses and engineering groups. With easy access to production data, engineering data from manufacturing processes, wafer probe data , final test data as well as other external data sources, DELTA Micro selects yieldWerx software for IC yield management yieldWerx helps TI resolve yield and characterization issues
yieldWerx Features and Benefits
yieldWerx allows the product, device and process engineers the ability to quickly study, diagnose and put in place corrective actions enabling fast and efficient product release as well as driving yield enhancements. With built in support in yieldWerx Database for STDF and ATDF data formats, and the ability to customize to your data formats, yieldWerx is the perfect solution for semiconductor test data analysis. .		yieldWerx Reports Free Download   Zonal Yield Wafer Probe Correlation Parametric Wafer Map Full Wafer Correlation Partial Wafer Correlation Final Test Correlation & Analysis Tester to Tester Yield Analysis Wafer Map Prober to Prober Yield Analysis Parametric Wafer Map Probe Card to Probe Card Yield Stacked Wafer Map Load Board to Load Board Yield Site to Site Yield Analysis
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